master test造句
例句與造句
- Appendix a : master test plan according to rup and tmap
附錄a ：按照rup和tmap的主測(cè)試計(jì)劃 - Master test guide for electrical measurement in power circuits
電源電路電氣測(cè)量的基本試驗(yàn)導(dǎo)則 - Master test guide for electrical measurements in power circuits
電源線路電氣測(cè)量的基本試驗(yàn)指南 - Tmap s master test plan can be compared to rup s master test plan
Tmap的主測(cè)試計(jì)劃可以比作rup的主測(cè)試計(jì)劃。 - The test manager draws up the master test plan during the inception phase
測(cè)試經(jīng)理在先啟階段草擬主測(cè)試計(jì)劃。 - It's difficult to find master test in a sentence. 用master test造句挺難的
- Master test build scripts
基本測(cè)試/構(gòu)建腳本 - Rup uses a master test plan for the overall project and an iteration test plan per iteration
Rup對(duì)整個(gè)項(xiàng)目使用一個(gè)主測(cè)試計(jì)劃，對(duì)每個(gè)迭代使用一個(gè)迭代測(cè)試計(jì)劃。 - Information technology - automatic identification and data capture techniques - bar code master test specifications
信息技術(shù).自動(dòng)識(shí)別和數(shù)據(jù)獲取技術(shù).條形碼總試驗(yàn)規(guī)范 - Information technology - automatic identification and data capture techniques - bar code master test specifications
信息技術(shù).自動(dòng)識(shí)別和數(shù)據(jù)捕獲技術(shù).條形碼總試驗(yàn)規(guī)范 - The master test plan and , more concretely , the iteration test plan indicate which builds need to be tested
主測(cè)試計(jì)劃和更具體的迭代測(cè)試計(jì)劃，需要簡(jiǎn)要說(shuō)明哪個(gè)構(gòu)建需要被測(cè)試。 - The master test plan and a detailed planning of test effort should be all that is produced prior to test execution
主測(cè)試計(jì)劃和測(cè)試工作的詳細(xì)計(jì)劃，應(yīng)當(dāng)是在測(cè)試執(zhí)行之前所產(chǎn)生的所有文檔。 - In any case , the master test plan needs to ensure that the st and at are complementary with regard to test coverage
無(wú)論如何，主測(cè)試計(jì)劃需要確保，系統(tǒng)測(cè)試和驗(yàn)收測(cè)試是有關(guān)測(cè)試覆蓋的補(bǔ)充。 - The required organization is part of the template for the master test plan and the iteration test plan , but the corresponding activity is unclear
需要的組織是主測(cè)試計(jì)劃和迭代測(cè)試計(jì)劃模版的一部分，但是相應(yīng)的活動(dòng)不清楚。 - Information technology - automatic identification and data capture techniques - bar code master test specifications iso iec 15421 : 2000 ; german version en iso iec 15421 : 2001
信息技術(shù).自動(dòng)識(shí)別和數(shù)據(jù)捕獲技術(shù).條形碼主要測(cè)試規(guī) - These test levels can be coordinated by means of a master test plan at the project level and an iteration test plan at the iteration level
這些測(cè)試級(jí)別可以是并列的，這取決于主測(cè)試計(jì)劃（在項(xiàng)目級(jí)）和迭代測(cè)試計(jì)劃（在迭代級(jí)） 。
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